David Lelouvier is an author at Philips (Netherlands) specializing in computer engineering, nuclear medicine, and hardware security.
Top concepts
DiagnosisEducationEngineeringMeasurementInstrumentationMedical ImagingNuclear MedicineSoftware TestingHardware SecurityBuilt-in Self-test
Publications per year
2002–2002
2
2
Enhanced reduced pin-count test for full-scan design
T. Waayers, Hervé Fleury, David Lelouvier · 2002 · 70 citations
Enhanced Reduced Pin-Count Test for Full-Scan Design
Harald Vranken, T. Waayers, Hervé Fleury et al. · Journal of Electronic Testing · 2002 · 10 citations
Rows per page
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