T. Jalowy

A 2π spectrometer for electron–electron coincidence studies on surfaces

M. Hattass, T. Jalowy, A. Czasch et al. · Review of Scientific Instruments · 2004 · 19 citations

Natural Sciences, Physics, Radiation Detection +16

Secondary ion emission dynamics model: A tool for nuclear track analysis

Peter Iza, L. S. Farenzena, T. Jalowy et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2006 · 16 citations

Natural Sciences, Nuclear Engineering, Physics +14

Dynamics of secondary ion emission: Novel energy and angular spectrometry

T. Jalowy, R. Neugebauer, M. Hattass et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2002 · 15 citations

Natural Sciences, Chemistry, Physics +9

Sputtering by highly charged ions: Application of the XY–TOF technique to secondary ion ejection from LiF

John M. Lenoir, P. Boduch, H. Rothard et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2007 · 11 citations

Natural Sciences, Materials Science, Physics +9