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Sputtering by highly charged ions: Application of the XY–TOF technique to secondary ion ejection from LiF

DOI

11

Citations

14

References

2007

Year

John M. Lenoir, P. Boduch, H. Rothard, B. Ban-d’Etat, T. Been, A. Cassimi, T. Jalowy, H. Lebius, B. Manil, Jean-Marc Ramillon
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

References

YearCitations

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