N. J. Harrick - Concepedia

Author

N. J. Harrick

Philips (United States)

Also Known As

Harrick, Nicolas James, N J Harrick, N. J. .. Harrick, N. J. Harrick, N.J Harrick, N.J. HARRICK, N.J. Harrick

Publications

4.6K

Citations

H-Index

108

Concepts

All Affiliations

Philips (United States)Philips (Finland)Hudson Institute IPS Research (United States)Corning (United States)

About

N. J. Harrick is an author at Philips (United States) specializing in engineering, applied physics, and optical properties.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	24	37	3.9K
2	Applied Physics	20	27	1.7K
3	Natural Sciences	15	16	2.6K
4	Medicine	3	3	124
5	Education	2	2	125

N. J. Harrick

Publications

3.9K

Citations

H-Index

Page 1

	Year	Citations
<i>Internal Reflection Spectroscopy</i> N. J. Harrick, Joseph G. Hoffman Physics Today EngineeringOptic DesignOptical PhysicsSpectroscopic PropertyGeometrical Optics	1968	1.7K
Electric Field Strengths at Totally Reflecting Interfaces N. J. Harrick Journal of the Optical Society of America EngineeringWave OpticFiber OpticsElectromagnetic CompatibilityOptical Properties	1965	224
Study of Physics and Chemistry of Surfaces from Frustrated Total Internal Reflections N. J. Harrick Physical Review Letters Materials ScienceSurface CharacterizationEngineeringPhysicsOptical Properties	1960	200
SURFACE CHEMISTRY FROM SPECTRAL ANALYSIS OF TOTALLY INTERNALLY REFLECTED RADIATION<sup>*</sup> N. J. Harrick The Journal of Physical Chemistry EngineeringNuclear DataAltmetric Attention ScoreBibliometricsChemistry	1960	194
Effective Thickness of Bulk Materials and of Thin Films for Internal Reflection Spectroscopy N. J. Harrick, F. K. Du Pré Applied Optics Optical MaterialsEngineeringEffective ThicknessOptical TestingThin Film Process Technology	1966	167
Hydrides and Hydroxyls in Thin Silicon Dioxide Films K. H. Beckmann, N. J. Harrick Journal of The Electrochemical Society Materials EngineeringEngineeringOptical PropertiesInternal Reflection SpectroscopySurface Science	1971	135
Optical Spectrum of the Semiconductor Surface States from Frustrated Total Internal Reflections N. J. Harrick Physical Review Transient GratingOptical MaterialsEngineeringAbsorption SpectroscopySemiconductor Surface States	1962	120
Determination of Refractive Index and Film Thickness from Interference Fringes N. J. Harrick Applied Optics Optical MaterialsEngineeringMeasurementOptical TestingInterferometry	1971	111
TOTAL INTERNAL REFLECTION AND ITS APPLICATION TO SURFACE STUDIES N. J. Harrick Annals of the New York Academy of Sciences EngineeringPhysicsMicroscopyOptical PropertiesReflection Removal	1963	88
Angular Dependence of Diffuse Reflectance Infrared Spectra. Part I: FT-IR Spectrogoniophotometer Paul J. Brimmer, Peter R. Griffiths, N. J. Harrick Applied Spectroscopy Optical MaterialsEngineeringOptical ArrangementOptical PropertiesSpectroscopy	1986	76

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