Beate Frankowsky is an author at Siemens (Hungary) specializing in calibration, quality metrics, and computer-aided design.
Top concepts
CalibrationEngineeringImage AnalysisQuality MetricsInverse ProblemsFlight ValidationSpace EngineeringOptical EngineeringComputer EngineeringComputer-aided Design
Publications per year
2003–2003
1
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Improvement of empirical OPC model robustness using full-chip aerial image analysis
Thomas Roessler, Beate Frankowsky, Olivier Toublan · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2003 · 12 citations
Light Intensity Distribution, Image Analysis, Engineering +15
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