Hyeonchan Lim

Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction

Sungyoul Seo, Yong Lee, Hyeonchan Lim et al. · 2015 · 27 citations

Engineering, Computer Engineering, Computer Science +16

Enhanced Postbond Test Architecture for Bridge Defects Between the TSVs

Jungil Mok, Hyeonchan Lim, Sungho Kang · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2021 · 16 citations

Engineering, Computer Engineering, Electrical Engineering +13

Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs

Youngwoo Lee, Hyeonchan Lim, Sungho Kang · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2016 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +13

Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks

Youngwoo Lee, Hyeonchan Lim, Youngkwang Lee et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2019 · 11 citations

Computing, Computer Engineering, Computer Science +10

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

Sungyoul Seo, Youngwoo Lee, Hyeonchan Lim et al. · IEEE Transactions on Semiconductor Manufacturing · 2020 · 10 citations

Engineering, Computer Engineering, Cluster Computing +12