J. R. Ayres

Electrical resistivity across a nematic quantum critical point

S. Licciardello, Jonathan Buhot, Jianming Lü et al. · Nature · 2019 · 128 citations

Natural Sciences, Materials Science, Physics +14

Deep levels of copper in silicon

S. D. Brotherton, J. R. Ayres, A. Gill et al. · Journal of Applied Physics · 1987 · 122 citations

Natural Sciences, Materials Science, Physics +17

Characterization of trapping states in polycrystalline-silicon thin film transistors by deep level transient spectroscopy

J. R. Ayres · Journal of Applied Physics · 1993 · 115 citations

Engineering, Electrical Engineering, Physics +17

Analysis of Drain Field and Hot Carrier Stability of Poly-Si Thin Film Transistors

J. R. Ayres, Stan D. Brotherton, D. McCulloch et al. · Japanese Journal of Applied Physics · 1998 · 79 citations

Engineering, Electrical Engineering, Materials Science +15

Influence of melt depth in laser crystallized poly-Si thin film transistors

S. D. Brotherton, D. McCulloch, J. P. Gowers et al. · Journal of Applied Physics · 1997 · 78 citations

Engineering, Materials Engineering, Materials Science +15