J. R. Ayres

Electrical resistivity across a nematic quantum critical point

S. Licciardello, Jonathan Buhot, Jianming Lü et al. · Nature · 2019 · 122 citations

Quantum Science, Engineering, Physics +5

Deep levels of copper in silicon

S. D. Brotherton, J. R. Ayres, A. Gill et al. · Journal of Applied Physics · 1987 · 121 citations

Semiconductors, Semiconductor Technology, Deep Levels +13

Characterization of trapping states in polycrystalline-silicon thin film transistors by deep level transient spectroscopy

J. R. Ayres · Journal of Applied Physics · 1993 · 114 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +15

Analysis of Drain Field and Hot Carrier Stability of Poly-Si Thin Film Transistors

J. R. Ayres, Stan D. Brotherton, D. McCulloch et al. · Japanese Journal of Applied Physics · 1998 · 79 citations

Device Modeling, Electrical Engineering, Engineering +12

Influence of melt depth in laser crystallized poly-Si thin film transistors

S. D. Brotherton, D. McCulloch, J. P. Gowers et al. · Journal of Applied Physics · 1997 · 78 citations

Optical Materials, Engineering, Energy Window +17