Concepedia

Ben van der Waal

BV

Statistics

Publications

1

Citations

63

H-Index

1

Active since

2016

Affiliations

Texas Instruments (United States)(Current)

Ben van der Waal is an author at Texas Instruments (United States) specializing in computer engineering, data mining, and computer vision.

Top concepts

Data MiningEngineeringData ScienceImage AnalysisComputer VisionComputer ScienceMachine LearningPattern RecognitionComputer EngineeringOptical Characterization

Publications per year

2016–2016

1

Publications

1

Wafer defect patterns recognition based on OPTICS and multi-label classification

Mengying Fan, Qin Wang, Ben van der Waal · 2016 · 63 citations

Engineering, Machine Learning, Optical Characterization +16

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