Statistics
Publications
1
Citations
12
H-Index
1
Active since
1995
Affiliations
Intel (United States)(Current)
V. Ochoa is an author at Intel (United States) specializing in diffusion barriers, device reliability, and materials engineering.
Publications per year
1995–1995
1
1
Effectiveness and Reliability of Metal Diffusion Barriers for Copper Interconnects
Gang Bai, S. Wittenbrock, V. Ochoa et al. · MRS Proceedings · 1995 · 12 citations
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