J.J. Ruiz-Pérez

Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectra

J.J. Ruiz-Pérez, J.M. González-Leal, Dorian Minkov et al. · Journal of Physics D Applied Physics · 2001 · 48 citations

Natural Sciences, Materials Engineering, Materials Science +17

The influence of Ar pressure on the structure and optical properties of non-hydrogenated a-Si thin films grown by rf magnetron sputtering onto room-temperature glass substrates

E. Márquez, Elías Saugar, Concepción García Vázquez et al. · Journal of Non-Crystalline Solids · 2019 · 40 citations

Natural Sciences, Materials Engineering, Materials Science +16

Derivation of the optical constants of thermally-evaporated uniform films of binary chalcogenide glasses using only their reflection spectra

J.M. González-Leal, E. Márquez, A.M. Bernal-Oliva et al. · Thin Solid Films · 1998 · 39 citations

Natural Sciences, Materials Science, Physics +12

Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization

E. Márquez, J.J. Ruiz-Pérez, Manuel Ballester et al. · Coatings · 2021 · 19 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Computation of the optical constants of thermally-evaporated thin films of GeSe₂chalcogenide glass from their reflection spectra

J.J. Ruiz-Pérez, E. Márquez, Dorian Minkov et al. · Physica Scripta · 1996 · 17 citations

Natural Sciences, Materials Science, Physics +17