Statistics
Publications
2
Citations
66
H-Index
2
Active since
2012
Affiliations
IBM (United States)(Current)
J. Ohm is an author at IBM (United States) specializing in grain structure analysis, electromigration, and metals.
Publications per year
2012–2014
2
2
Electromigration in Cu(Al) and Cu(Mn) damascene lines
Chunhua Hu, J. Ohm, Lynne Gignac et al. · Journal of Applied Physics · 2012 · 54 citations
Natural Sciences, Materials Engineering, Materials Science +13
Microstructure, impurity and metal cap effects on Cu electromigration
Chao Hu, L. G. Gignac, J. Ohm et al. · AIP conference proceedings · 2014 · 12 citations
Natural Sciences, Materials Engineering, Materials Science +16
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