Concepedia

Y.-C. Liu

YL

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Publications

1

Citations

23

H-Index

1

Active since

1998

Affiliations

Vanguard International Semiconductor (Taiwan)(Current)

Y.-C. Liu is an author at Vanguard International Semiconductor (Taiwan) specializing in gate-induced drain leakage, semiconductor devices, and interface states.

Publications per year

1998–1998

1

Publications

1

A three-terminal band-trap-band tunneling model for drain engineering and substrate bias effect on GIDL in MOSFET

J.C. Guo, Y.-C. Liu, Ming-Yueh Chou et al. · IEEE Transactions on Electron Devices · 1998 · 23 citations

Engineering, Electrical Engineering, Electronic Materials +12

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