R. C. Sanwald

“Standardization” of field emission measurements

V.V. Zhirnov, C. Lizzul-Rinne, G. J. Wojak et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2001 · 57 citations

Materials Science, Field Emission Devices, Environmental Monitoring +15

Field emission from ultrathin coatings of AlN on Mo emitters

Dong Gwon Kang, V.V. Zhirnov, R. C. Sanwald et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2001 · 41 citations

Aluminium Nitride, Engineering, Thin Film Process Technology +16

Optical characterization of wide band gap amorphous semiconductors (a-Si:C:H): Effect of hydrogen dilution

Minseo Park, Chunlin Teng, V. Sakhrani et al. · Journal of Applied Physics · 2001 · 41 citations

Materials Science, Semiconductors, Optical Materials +15

A method for indexing field ion micrographs

Robert W. Newman, R. C. Sanwald, J. J. Hren · Journal of Scientific Instruments · 1967 · 39 citations

Analytical Instrumentation, Measurement, Microscopy +13

COMPUTER-SIMULATED ION-EMISSION IMAGES OF DISLOCATIONS: SCREW DISLOCATION AT THE CENTER OF {420}

R. C. Sanwald, Sarath Ranganathan, J. J. Hren · Applied Physics Letters · 1966 · 22 citations