Apo Sezginer

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Active since

2003

Affiliations

Advanced Micro Devices (United States)(Current)

Apo Sezginer is an author at Advanced Micro Devices (United States) specializing in optical metrology, vibration-insensitive metrology, and natural sciences.

Publications per year

2003–2007

Publications

Scatterometry-based overlay metrology

Hsu-Ting Huang, Gayathri Raghavendra, Apo Sezginer et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2003 · 25 citations

Natural Sciences, Materials Engineering, Materials Science +17

Double patterning technology: process-window analysis in a many-dimensional space

Apo Sezginer, Bayram Yenikaya, Wolfgang Staud · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 16 citations

Computing, Visualization, Data Visualization +12

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