T.W. Williams

Iddq test: sensitivity analysis of scaling

T.W. Williams, R.H. Dennard, R. Kapur et al. · 2002 · 152 citations

Engineering, Vlsi Design, Measurement +19

An industrial view of electronic design automation

Don MacMillen, Raúl Camposano, Dwight D. Hill et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2000 · 91 citations

Engineering, Industrial Engineering, Electronic Design Automation +21

Signal integrity problems in deep submicron arising from interconnects between cores

Petra Nordholz, D. Treytnar, J. Otterstedt et al. · 2002 · 65 citations

Aggressive Drive, Engineering, Signal Integrity Problems +18

Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials.

T.W. Williams, Wilfried Daehn, M. Gruetzner et al. · International Test Conference · 1986 · 61 citations

Iddq testing for high performance CMOS-the next ten years

T.W. Williams, R. Kapur, M.R. Mercer et al. · 2002 · 46 citations

Engineering, Vlsi Design, Computer Architecture +17