Chong-Gun Yu

Device design guidelines for nano-scale MuGFETs

Chi‐Woo Lee, Se-Re-Na Yun, Chong-Gun Yu et al. · Solid-State Electronics · 2007 · 108 citations

Device Design Guidelines, Electrical Engineering, Miniaturization +4

RF performance degradation in nMOS transistors due to hot carrier effects

Jong‐Tae Park, Byung-Jin Lee, Dongwook Kim et al. · IEEE Transactions on Electron Devices · 2000 · 79 citations

Electrical Engineering, Transconductance Degradation, Engineering +12

An automatic offset compensation scheme with ping-pong control for CMOS operational amplifiers

Chong-Gun Yu, R.L. Geiger · IEEE Journal of Solid-State Circuits · 1994 · 71 citations

Engineering, Circuit System, Mixed-signal Integrated Circuit +9

A comparative study on hot carrier effects in inversion-mode and junctionless MuGFETs

Sueng Min Lee, Jin Young Kim, Chong-Gun Yu et al. · Solid-State Electronics · 2012 · 32 citations

Electrical Engineering, Engineering, Bias Temperature Instability +5

Hot carrier degradation of InGaZnO thin film transistors under light illumination at the elevated temperature

Sueng Min Lee, Chong-Gun Yu, Won-Ju Cho et al. · Solid-State Electronics · 2012 · 27 citations

Electrical Engineering, Engineering, Hot Carrier Degradation +8