Yuwei Wang

Comprehensive Investigation of Gate Oxide Instability in 4H-SiC MOSFETs and MOS Capacitors Under High Gate Bias Stress

Haonan Chen, Kanghua Yu, Jieqin Ding et al. · IEEE Transactions on Electron Devices · 2023 · 18 citations

Engineering, Electrical Engineering, Microelectronics +16

Efficient and Dense Electron Emission from a SiO₂ Tunneling Diode with Low Poisoning Sensitivity

Zhiwei Li, Zhengfeng Zhang, Jiamin Tian et al. · Nano Letters · 2022 · 17 citations

Engineering, Electrical Engineering, Physics +15

High‐Performance On‐Chip Thermionic Electron Micro‐Emitter Arrays Based on Super‐Aligned Carbon Nanotube Films

Yuwei Wang, Xiang Li, Wei Yang et al. · Advanced Functional Materials · 2019 · 15 citations

Engineering, Electrical Engineering, Materials Science +17

On-Chip Thermionic Electron Emitter Arrays Based on Horizontally Aligned Single-Walled Carbon Nanotubes

Yuwei Wang, Fang Li, Xiang Li et al. · IEEE Transactions on Electron Devices · 2019 · 14 citations

Engineering, Electrical Engineering, Physics +15

Negative Bias Temperature Instability in Top-Gated Carbon Nanotube Thin Film Transistors With Y₂O₃ Gate Dielectric

Yuwei Wang, Sha Wang, Huaidong Ye et al. · IEEE Transactions on Device and Materials Reliability · 2023 · 12 citations

Engineering, Electrical Engineering, Materials Science +17