Sakshi Jain is an author at Intel (United Kingdom) specializing in instrumentation, design for testing, and electromagnetic compatibility.
Top concepts
EngineeringInstrumentationMicroelectronicsHardware SecurityBuilt-in Self-testDesign For TestingComputer EngineeringComputer ArchitectureElectrical EngineeringElectromagnetic Compatibility
Publications per year
2006–2006
1
1
Testing high-speed IO links using on-die circuitry
Prakash Iyer, Sakshi Jain, Bryan Casper et al. · 2006 · 11 citations
Hardware Security, Electrical Engineering, Jtag Protocol +13
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