J. F. M. van Rens - Concepedia

Author

J. F. M. van Rens

Eindhoven University of Technology ORCID

Also Known As

J. F. M. van Rens, J.F.M. van Rens, Jasper F. M. van Rens, Jasper F.M. van Rens, van Rens, J. F. M.

Publications

228

Citations

H-Index

Concepts

All Affiliations

Eindhoven University of Technology Thermo Fisher Scientific (Netherlands)

About

J. F. M. van Rens is an author at Eindhoven University of Technology specializing in engineering, physics, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	5	5	190
2	Natural Sciences	4	4	143
3	Applied Physics	4	4	143
4	Physics	4	4	143
5	Materials Science	1	1	48

J. F. M. van Rens

Publications

227

Citations

H-Index

Page 1

	Year	Citations
High quality ultrafast transmission electron microscopy using resonant microwave cavities W. Verhoeven, J. F. M. van Rens, E. R. Kieft, Ultramicroscopy EngineeringElectron MicroscopyPhysicsMicroscopyNatural Sciences	2018	63
Discovering Hidden Material Properties of MgCl<sub>2</sub> at Atomic Resolution with Structured Temporal Electron Illumination of Picosecond Time Resolution Christian Kisielowski, Petra Specht, Bert Freitag, Advanced Functional Materials Hidden Material PropertiesEngineeringSolid-state ChemistryElectron DiffractionStructural Materials	2019	48
Induced Liquid Phase Flow by RF Ar Cold Atmospheric Pressure Plasma Jet J. F. M. van Rens, Jan T. Schoof, Fanny C. Ummelen, IEEE Transactions on Plasma Science Cold Atmospheric PlasmaDownward ForceEngineeringAerospace EngineeringFluid Mechanics	2014	47
Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM 110 mode for ultrafast electron microscopy J. F. M. van Rens, W. Verhoeven, J. G. H. Franssen, Ultramicroscopy Ultrafast Electron MicroscopyEngineeringElectron MicroscopyPhysicsMicroscopy	2017	21
Design and characterization of dielectric filled TM110 microwave cavities for ultrafast electron microscopy W. Verhoeven, J. F. M. van Rens, A.H. Kemper, Review of Scientific Instruments	2019	19
Time-of-flight electron energy loss spectroscopy using TM110 deflection cavities W. Verhoeven, J. F. M. van Rens, M. A. W. van Ninhuijs, Structural Dynamics	2016	18
Time-of-flight electron energy loss spectroscopy by longitudinal phase space manipulation with microwave cavities W. Verhoeven, J. F. M. van Rens, W. F. Toonen, Structural Dynamics EngineeringMicrowave CavitiesPulsed Electron BeamElectron OpticEnergy Losses	2018	11

Page 1