Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM 110 mode for ultrafast electron microscopy - Concepedia

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Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM 110 mode for ultrafast electron microscopy

DOI Full Paper Access

21

Citations

32

References

2017

Year

J. F. M. van Rens, W. Verhoeven, J. G. H. Franssen, Adam Lassise, X. F. D. Stragier, E. R. Kieft, P.H.A. Mutsaers, O.J. Luiten

Ultramicroscopy

Ultrafast Electron MicroscopyEngineeringElectron MicroscopyPhysicsMicroscopyNatural SciencesSpectroscopyTm 110Applied PhysicsElectron DiffractionElectron MicroscopeSynchrotron RadiationFree Electron Laser

References

	Year	Citations

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