Jean-Etienne Sauvestre

Impact of the Radial Ionization Profile on SEE Prediction for SOI Transistors and SRAMs Beyond the 32-nm Technological Node

M. Raine, G. Hubert, Marc Gaillardin et al. · IEEE Transactions on Nuclear Science · 2011 · 94 citations

Electrical Engineering, Ion Implantation, Engineering +15

Effect of the Ion Mass and Energy on the Response of 70-nm SOI Transistors to the Ion Deposited Charge by Direct Ionization

M. Raine, Marc Gaillardin, Jean-Etienne Sauvestre et al. · IEEE Transactions on Nuclear Science · 2010 · 50 citations

Electrical Engineering, Transistor Electric Response, Transistor Sensitive Volume +13

Using BaF2 crystals as detectors of light charged particles at intermediate energies

G. Lanzanò, A. Pagano, Salvatore Urso et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1992 · 35 citations

Engineering, Radiation Detection, Physics +6

Equilibrium versus non-equilibrium emission in projectile fragmentation for the 40Ar + natAg system at 58.7 A MeV

Jean-Etienne Sauvestre, J. L. Charvet, R. Dayras et al. · Physics Letters B · 1994 · 14 citations

Engineering, Physics, Aerospace Engineering +4

Evidence for a Radiation Induced Electromotive Force (RIEMF) in Dielectrics Exposed to Very High 14 MeV Neutron Flux by Means of Neutron Induced Recoils

J.L. Leray, S. Bazzoli, Jean-Etienne Sauvestre et al. · IEEE Transactions on Nuclear Science · 2008 · 13 citations

Engineering, Nuclear Physics, Radiation Physics +19