Takumi Mikawa

Highly reliable TaOx ReRAM and direct evidence of redox reaction mechanism

Zhiqiang Wei, Yuchi Kanzawa, K. Arita et al. · 2008 · 334 citations

Natural Sciences, Materials Engineering, Materials Science +16

An 8 Mb Multi-Layered Cross-Point ReRAM Macro With 443 MB/s Write Throughput

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda et al. · IEEE Journal of Solid-State Circuits · 2012 · 302 citations

Engineering, Computer Engineering, Electrical Engineering +15

A 4M Synapses integrated Analog ReRAM based 66.5 TOPS/W Neural-Network Processor with Cell Current Controlled Writing and Flexible Network Architecture

Reiji Mochida, Kazuyuki Kouno, Yuriko Hayata et al. · 2018 · 186 citations

Engineering, Computer Engineering, Analog Electronics +15

An 8Mb multi-layered cross-point ReRAM macro with 443MB/s write throughput

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda et al. · 2012 · 139 citations

Engineering, Computer Engineering, Electrical Engineering +15

Demonstration of high-density ReRAM ensuring 10-year retention at 85°C based on a newly developed reliability model

Zhiqiang Wei, T. Takagi, Yuchi Kanzawa et al. · 2011 · 116 citations

Engineering, Electrical Engineering, Materials Science +15