J. H. Lim

JEDEC-Qualified Highly Reliable 22nm FD-SOI Embedded MRAM For Low-Power Industrial-Grade, and Extended Performance Towards Automotive-Grade-1 Applications

V. B. Naik, K. Yamane, Tae Young Lee et al. · 2020 · 43 citations

Fd-soi 40Mb, Non-volatile Memory, Engineering +16

22-nm FD-SOI Embedded MRAM Technology for Low-Power Automotive-Grade-l MCU Applications

K. Lee, K. Yamane, V. B. Naik et al. · 2018 · 42 citations

Magnetism, Electrical Engineering, 22-Nm Fd-soi 40Mb +13

22-nm FD-SOI Embedded MRAM with Full Solder Reflow Compatibility and Enhanced Magnetic Immunity

K. Lee, K. Yamane, S. M. Noh et al. · 2018 · 34 citations

Magnetism, Electrical Engineering, Enhanced Magnetic Immunity +15

Advanced MTJ Stack Engineering of STT-MRAM to Realize High Speed Applications

Tae Young Lee, K. Yamane, Y. Otani et al. · 2020 · 20 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +18

Investigating the Statistical-Physical Nature of MgO Dielectric Breakdown in STT-MRAM at Different Operating Conditions

J. H. Lim, Nagarajan Raghavan, Andrea Padovani et al. · 2018 · 18 citations · Full text

Engineering, Ultra-thin Dielectric Breakdown, Magnetism +18