J. H. Lim - Concepedia

Author

J. H. Lim

GlobalFoundries (Singapore)ORCID

Also Known As

J. H. Lim, J.H. Lim, Jihye Lim, Jisoo Lim, K. Lee

Publications

339

Citations

H-Index

Concepts

All Affiliations

GlobalFoundries (Singapore)Singapore University of Technology and Design

About

J. H. Lim is an author at GlobalFoundries (Singapore) specializing in electrical engineering, microelectronics, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	5	5	157
2	Electrical Engineering	5	5	157
3	Computer Engineering	4	4	139
4	Applied Physics	2	2	38
5	Physics	1	1	18

J. H. Lim

Publications

203

Citations

H-Index

Page 1

	Year	Citations
JEDEC-Qualified Highly Reliable 22nm FD-SOI Embedded MRAM For Low-Power Industrial-Grade, and Extended Performance Towards Automotive-Grade-1 Applications V. B. Naik, K. Yamane, Tae Young Lee, Fd-soi 40MbNon-volatile MemoryEngineeringIntegrated CircuitsMulti-channel Memory Architecture	2020	43
22-nm FD-SOI Embedded MRAM Technology for Low-Power Automotive-Grade-l MCU Applications K. Lee, K. Yamane, V. B. Naik, MagnetismElectrical Engineering22-Nm Fd-soi 40MbEngineeringVlsi Design	2018	42
22-nm FD-SOI Embedded MRAM with Full Solder Reflow Compatibility and Enhanced Magnetic Immunity K. Lee, K. Yamane, S. M. Noh, MagnetismElectrical EngineeringEnhanced Magnetic ImmunityEflash ApplicationsEngineering	2018	34
Advanced MTJ Stack Engineering of STT-MRAM to Realize High Speed Applications Tae Young Lee, K. Yamane, Y. Otani, Non-volatile MemoryEngineeringEmerging Memory TechnologyComputer ArchitectureHardware Systems	2020	20
Investigating the Statistical-Physical Nature of MgO Dielectric Breakdown in STT-MRAM at Different Operating Conditions J. H. Lim, Nagarajan Raghavan, Andrea Padovani, EngineeringUltra-thin Dielectric BreakdownMagnetismMgo BdDifferent Operating Conditions	2018	18
Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production Tae Young Lee, K. Yamane, L. Y. Hau,	2020	13
Area and pulsewidth dependence of bipolar TDDB in MgO magnetic tunnel junction J. H. Lim, Nagarajan Raghavan, Sen Mei,	2018	11
Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities V. B. Naik, J. H. Lim, K. Yamane, 2022 IEEE International Reliability Physics Symposium (IRPS)	2022	11
Exploring diverse interests of collaborators in smart cities: A topic analysis using LDA and BERT J. H. Lim, Junseok Hwang Heliyon	2024	11

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