Concepedia

Author

Yunfei En

China Electronic Product Reliability and Environmental Test InstituteORCID

Also Known As

En Yun-fei, Y F En, Y. F. En, Y.F. En, Yun-Fei En, Yun-fei En, YunFei En, Yunfei EN, Yunfei En, Yun‐fei En

208

Publications

2K

Citations

23

H-Index

115

Concepts

All Affiliations

China Electronic Product Reliability and Environmental Test InstituteMinistry of Industry and Information TechnologyXidian UniversitySouth China University of TechnologyChinese Academy of Sciences
YE

About

Yunfei En is an author at China Electronic Product Reliability and Environmental Test Institute specializing in engineering, electrical engineering, and applied physics.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

23

55

1.4K

2

Applied Physics

16

27

571

3

Education

6

6

209

4

Medicine

2

2

128

5

Natural Sciences

2

2

40

Yunfei En

×

65

Publications

1.6K

Citations

23

H-Index

YearCitations

Simultaneous Measurement of Electric and Magnetic Fields With a Dual Probe for Efficient Near-Field Scanning

Weiheng Shao, Wenxiao Fang, Yun Huang,

IEEE Transactions on Antennas and Propagation

2019

104

Biomimetic Ant-Nest Electrode Structures for High Sulfur Ratio Lithium–Sulfur Batteries

Guo Ai, Yiling Dai, Wenfeng Mao,

Nano Letters

2016

75

Polarity effect of electromigration on intermetallic compound formation in SnPb solder joints

Yudong Lu, Xiaoqi He, Yunfei En,

Acta Materialia

2009

68

Effect of Hydrogen on Defects of AlGaN/GaN HEMTs Characterized by Low-Frequency Noise

Yiqiang Chen, Yichi Zhang, Y. Y. Liu,

IEEE Transactions on Electron Devices

2018

57

Noncontact RF Voltage Sensing of a Printed Trace via a Capacitive-Coupled Probe

Wenxiao Fang, Haimi Qiu, Chengyang Luo,

IEEE Sensors Journal

2018

55

Movable Noncontact RF Current Measurement on a PCB Trace

Haimi Qiu, Wenxiao Fang, Yunfei En,

IEEE Transactions on Instrumentation and Measurement

2017

51

Magnetic Near-Field Measurement With a Differential Probe to Suppress Common Mode Noise

Weiheng Shao, Wenxiao Fang, Rongquan Chen,

IEEE Sensors Journal

2019

42

Total-Ionizing-Dose Induced Coupling Effect in the 130-nm PDSOI I/O nMOSFETs

Chao Peng, Zhiyuan Hu, Bingxu Ning,

IEEE Electron Device Letters

2014

40

Total Dose Ionizing Radiation Effects in the Indium–Zinc Oxide Thin-Film Transistors

Yuan Liu, Weijing Wu, Yunfei En,

IEEE Electron Device Letters

2014

39

Analysis and Simulation of Low-Frequency Noise in Indium-Zinc-Oxide Thin-Film Transistors

Yuan Liu, Hongyu He, Rongsheng Chen,

IEEE Journal of the Electron Devices Society

2018

37

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