2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

Venue (Conference)

134

Publications

575

Citations

Concepts

2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) is a conference.

#	Concept	H-Index	Publications	Citations
1	Engineering	3	3	48
2	Education	1	1	15
3	Management	1	1	13
4	Social Sciences	1	1	20
5	Behavioral Sciences	1	1	20

2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

134

Publications

575

Citations

Showing yearly statistics from 2000-2026.

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