Diagnosis and repair method of SoC memory

Abstract

Abstract: – An exact method of memory elements diagnosis and repair by spares that enables to cover a set of fault cells by minimally possible quantity of spares is represented. The method is oriented on implementation to the Infrastructure Intellectual Property for SoC functionality. It enables to raise yield essentially on the electronic technology market by means of faulty chip repair in the process of production and operation, as well as to increase the life cycle duration of memory matrixes by repair of them in real time.