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Optical characterization of polycrystalline ZnSe1−xTex thin films using variable angle spectroscopic ellipsometry and spectrophotmetery techniques

Materials ScienceIi-vi SemiconductorOptical MaterialsEngineeringOptical PropertiesSurface ScienceApplied PhysicsSpectrophotmetery TechniquesThin Film Process TechnologyThin FilmsOptical CharacterizationOptoelectronicsThin Film Processing