Concepedia

Publication | Closed Access

Robustness of 1.2kV SiC MOSFET devices

DOI

60

Citations

12

References

2013

Year

D. Othman, Stéphane Lefebvre, Mounira Berkani, Zoubir Khatir, Ali Ibrahim, A. Bouzourene
Microelectronics Reliability

References

YearCitations

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