Expert Systems with Applications · 2024 · 12 citations · 35 references
ComputingComputer ScienceManufacturing EngineeringComputer VisionMachine LearningMachine VisionDeep LearningDefect ClassificationDefect DetectionDefect ModelingFault DetectionIndustrial InspectionAutomated Defect RecognitionDefect AnalysisImage-based Defect ClassificationReal-time Defect DetectionSemiconductor Wafer Inspection
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