Integrated mid-infrared sensing and ultrashort lasers based on wafer-level Td-WTe2 Weyl semimetal

Abstract

There is an urgent need for infrared (IR) detection systems with high-level miniaturization and room-temperature operation capability. The rising star of two-dimensional (2D) semimetals with extraordinary optoelectronic properties can fulfill these criteria. However, the formidable challenges with regard to large-scale patterning and substrate-selective requirements limit material deposition options for device fabrication. Here, we report a convenient and straightforward eutectic-tellurization transformation method for the wafer-level synthesis of 2D type-II Weyl semimetal WTe2. The non-cryogenic WTe2/Si Schottky junction device displays an ultrawide detection range covering 10.6 μm with a high detectivity of ∼109 Jones in the mid-infrared (MIR) region and a short response time of 1.3 μs. The detection performance has surpassed most reported IR sensors. On top of that, on-chip device arrays based on Schottky junction display an outstanding MIR imaging capability without cryogenic cooling, and 2D WTe2 Weyl semimetal can serve as a saturable absorber for stable Q-switched and mode-locked laser operation applications. Our work offers a viable route for wafer-scale vdW preparation of 2D semimetals, showcasing their intriguing potential in on-chip integrated MIR detection systems and ultrafast laser photonics.