GM-DETR: Research on a Defect Detection Method Based on Improved DETR

Abstract

Defect detection is an indispensable part of the industrial intelligence process. The introduction of the DETR model marked the successful application of a transformer for defect detection, achieving true end-to-end detection. However, due to the complexity of defective backgrounds, low resolutions can lead to a lack of image detail control and slow convergence of the DETR model. To address these issues, we proposed a defect detection method based on an improved DETR model, called the GM-DETR. We optimized the DETR model by integrating GAM global attention with CNN feature extraction and matching features. This optimization process reduces the defect information diffusion and enhances the global feature interaction, improving the neural network's performance and ability to recognize target defects in complex backgrounds. Next, to filter out unnecessary model parameters, we proposed a layer pruning strategy to optimize the decoding layer, thereby reducing the model's parameter count. In addition, to address the issue of poor sensitivity of the original loss function to small differences in defect targets, we replaced the L1 loss in the original loss function with MSE loss to accelerate the network's convergence speed and improve the model's recognition accuracy. We conducted experiments on a dataset of road pothole defects to further validate the effectiveness of the GM-DETR model. The results demonstrate that the improved model exhibits better performance, with an increase in average precision of 4.9% (mAP@0.5), while reducing the parameter count by 12.9%.