All-optical subcycle microscopy on atomic length scales - Concepedia

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All-optical subcycle microscopy on atomic length scales

45

Citations

52

References

2024

Year

Thomas Siday, Johannes Hayes, Felix Schiegl, Fabian Sandner, Peter Menden, Valentin Bergbauer, Martin Zizlsperger, Svenja Nerreter, Sonja Lingl, Jascha Repp,

Atomic Length ScalesEngineeringPhysicsMicroscopyOptical PropertiesMicroscopy MethodScanning Probe MicroscopyApplied PhysicsAtomic PhysicsLight Microscopy

References

	Year	Citations

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