IEEE Transactions on Transportation Electrification · 2024 · 20 citations · 33 references
EngineeringElectrical EngineeringMechanical EngineeringApplied MechanicsSurface EngineeringTribologyContact MechanicsFrictional ResistanceSliding ContactSurface MetrologySurface RoughnessSurface Roughness EffectsConductionContact ResistanceCurrent CollectionElectric LocomotivesFrictionRoughnessRoughness ParametersSurface Roughness Parameters
Pantograph-catenary systems are the key equipment for current conduction from power grids to electric locomotives, and within such a system, the property of the slide, especially the contact resistance ( <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>j</sub></i> ), directly affects its current collection performance. Compared to previous studies, this paper focuses on the microscopic roughness parameters which affects <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>j</sub></i> greatly. The changing rule of <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>j</sub></i> under different roughness conditions is studied on 128 groups of data collected from experiments. More importantly, the second-order partial correlation coefficient is introduced to quantify the impact strength of different roughness parameters on <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>j</sub></i> . Based on this, a multi-parameter influence model of <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>j</sub></i> is established and verified by non-linear fitting. The results show that the impact strength of the relevant roughness parameters is ranked as <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>pc</sub></i> > <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>p</sub></i> > <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>sm</sub></i> . The conclusion provides a theoretical basis for minimizing pantograph-catenary <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">R<sub>j</sub></i> and improving current collection quality. Moreover, it facilitates slide material selection and contributes to new prototype design.
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Yang Song, Zhigang Liu, Anders Rxnnquist et al. · IEEE Transactions on Instrumentation and Measurement · 2020 · 190 citations · Full text
Engineering, Electrical Engineering, Mechanical Engineering +14
Pradeep V. Badiger, Vijay Desai, B. K. Prajwala et al. · Arabian Journal for Science and Engineering · 2019 · 78 citations
Engineering, Manufacturing Engineering, Materials Science +14