Concepedia

XRD peak broadening modelling for Al-alloys characterization compared with Rietveld profile analysis

Mostafa Y. A. Mostafa, Ahmed Mostafa, M.A. Abdel-Rahman, E.E. Assem, Ali M. Ashour, Emad A. Badawi

Materials Today Proceedings · 2023 · 13 citations · 15 references

DOI

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References

15

IOP Conf. Ser.: Mater. Sci. Eng. 117 012045

Menghuai Wu, Alexander Vakhrushev, Andreas Ludwig et al. · 2016 · 5K citations

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Modified Scherrer Equation to Estimate More Accurately Nano-Crystallite Size Using XRD

Ahmad Monshi, Mohammad Reza Foroughi, Mohammad Reza Monshi · World Journal of Nano Science and Engineering · 2012 · 2.4K citations · Full text

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Whole powder pattern modelling

Paolo Scardi, Matteo Leoni · Acta Crystallographica Section A Foundations of Crystallography · 2002 · 540 citations

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OriginPro 9.1: Scientific Data Analysis and Graphing Software—Software Review

E. Seifert · Journal of Chemical Information and Modeling · 2014 · 506 citations

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Improving All‐Inorganic Perovskite Photodetectors by Preferred Orientation and Plasmonic Effect

Yuhui Dong, Yu Gu, Yousheng Zou et al. · Small · 2016 · 403 citations

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