Effect of argon pressure on the physical characteristics of cadmium telluride (CdTe) thin films by close-spaced sublimation

The Long-Wavelength Edge of Photographic Sensitivity and of the Electronic Absorption of Solids

F. Urbach · Physical Review · 1953 · 5.8K citations

Photonics, Engineering, Physics +13

Disorder and the Optical-Absorption Edge of Hydrogenated Amorphous Silicon

George D. Cody, T. Tiedje, B. Abeles et al. · Physical Review Letters · 1981 · 1.2K citations

Materials Science, Ii-vi Semiconductor, Optical Materials +14

Silicon Nanowires for Solar Thermal Energy Harvesting: an Experimental Evaluation on the Trade-off Effects of the Spectral Optical Properties

Abdoul Karim Sekone, Yu‐Bin Chen, Ming‐Chang Lu et al. · Nanoscale Research Letters · 2016 · 1K citations · Full text

Electrical Engineering, Energy Harvesting, Silicon Nanowires +15

Review Article: Stress in thin films and coatings: Current status, challenges, and prospects

G. Abadias, Eric Chason, Jozef Kečkéš et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2018 · 764 citations · Full text

Thin Film Physics, Engineering, Stress Evolution +20

X-ray peak broadening analysis in ZnO nanoparticles

N. Rajeswari Yogamalar, R. Srinivasan, Ajayan Vinu et al. · Solid State Communications · 2009 · 568 citations

Materials Science, X-ray Spectroscopy, Engineering +6