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Growth characteristics and properties of Ga<sub>2</sub>O<sub>3</sub> films fabricated by atomic layer deposition technique

24

Citations

93

References

2022

Year

Abstract

The review summarizes the precursors, characterization techniques, factors moderating film growth, and the properties such as crystal structure, chemical composition, surface morphology, and optical properties of Ga 2 O 3 films fabricated by ALD.

References

YearCitations

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