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A general one-step plug-and-probe approach to top-gated transistors for rapidly probing delicate electronic materials

Electrical EngineeringEngineeringElectronic MaterialsTunneling MicroscopyNanotechnologyDelicate Electronic MaterialsScanning Probe MicroscopyApplied PhysicsSemiconductor Device FabricationTop-gated TransistorsElectronic PackagingMicroelectronicsSemiconductor Device