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Electrical characteristics of large scale integration (LSI) MOSFETs at very high temperatures part II: Experiment

Device ModelingElectrical CharacteristicsElectrical EngineeringEngineeringNanoelectronicsBias Temperature InstabilityLarge Scale IntegrationThermodynamicsPower ElectronicsHeat TransferMicroelectronicsThermal EngineeringInterconnect (Integrated Circuits)Semiconductor Device