Publication | Closed Access
2010 VLSI technology symposium
83
Citations
0
References
2010
Year
Unknown Venue
The following topics are dealt with: VLSI technology; advanced CMOS; reliability; stability; MRAM; x-point RRAM; ultra thin body FDSOI; process technology; 3D integration; NAND flash memory; design enablement; heterogenous integration; DRAM; PCRAM; and GeMOSFET.