Publication | Closed Access
EBT: A Comprehensive Test Generation Technique for Highly Sequential Circuits
64
Citations
5
References
1978
Year
Unknown Venue
Functional ModelsEngineeringMem TestingVerificationComputer ArchitectureTest Data GenerationHardware SystemsFormal VerificationTest BenchSequential CircuitsAsynchronous CircuitsElectrical EngineeringSpecific FaultsComputer EngineeringBuilt-in Self-testHighly Sequential CircuitsComputer ScienceMicroelectronicsDesign For TestingProgram AnalysisSoftware TestingFormal MethodsCombinatorial Testing Workflow
A new test generation technique for highly sequential circuits, utilizing functional models, with ability to produce tests for specific faults while avoiding races, is presented.
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