Integrated Intensities and Lattice Parameters for Mo ₅ Si ₃

Abstract

An expanded listing of experimental and calculated X‐ray diffraction integrated intensities as well as “d” spacings is given for Mo s Si). The intensity data are found to be in excellent agreement with the space group 14/mem (x =0.075, y =0.224 for Mo positions and x ∼0.167 for Si). Mo 5 Si 3 lattice parameters, corresponding to the tetragonal system, and a =0.96425 ± 0.00005, c =0.49096 ±0.00003 mm.