Publication | Closed Access
Inter-device reliability of the NPi-200 and NPi-300 pupillometers
23
Citations
25
References
2022
Year
ReliabilityElectrical EngineeringEngineeringHardware ReliabilityMeasurementCalibrationOptical TestingEducationElectronic PackagingInstrumentationNpi-300 PupillometersDevice Reliability
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|---|---|---|
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