WDP-BNN: Efficient wafer defect pattern classification via binarized neural network

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A survey on Image Data Augmentation for Deep Learning

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Computing, Computer Science, Biomedical Imaging +12

Acceleration of Stochastic Approximation by Averaging

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Principal-components analysis and exploratory and confirmatory factor analysis.

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Deep normalized convolutional neural network for imbalanced fault classification of machinery and its understanding via visualization

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