Concepedia

Publication | Open Access

Automated measurement and analysis of sidewall roughness using three-dimensional atomic force microscopy

DOIFull Paper Access

11

Citations

8

References

2022

Year

Su-Been Yoo, Seong-Hun Yun, Ah-Jin Jo, Sang‐Joon Cho, Haneol Cho, Junho Lee, Byoung-Woon Ahn
Han-guk hyeonmigyeong hakoeji/Applied microscopy

References

YearCitations

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