Chemical element mapping by x-ray computational ghost fluorescence

Abstract

Chemical element mapping is an imaging tool that provides essential information about composite materials, and it is crucial for a broad range of fields ranging from fundamental science to numerous applications. Methods that exploit x-ray fluorescence are very advantageous and are widely used, but require focusing of the input beam and raster scanning of the sample. Thus, the methods are slow and exhibit limited resolution due to focusing challenges. Here, we demonstrate an x-ray fluorescence method based on computational ghost imaging that overcomes those limitations since it does not require focusing and show that when it is combined with compressed sensing the total measurement time can be significantly reduced. Our method opens the possibility to significantly enhance the resolution of chemical element maps and to extend the applicability of x-ray fluorescence inspection to new fields where the measurement time is a critical parameter.