Concepedia

In-situ monitoring of the growth of Bi2 Te2 and Sb2 Te3 films and Bi2 Te3-Sb2 Te3 superlattice using spectroscopic ellipsometry

Hao Cui, Ishwara Bhat, Brooks O’Quinn, R. Venkatasubramanian

Journal of Electronic Materials · 2001 · 20 citations · 17 references

DOI

Concepts

References

17

<i>Ellipsometry and Polarized Light</i>

R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations

, , +13

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

Craig M. Herzinger, Blaine Johs, William A. McGahan et al. · Journal of Applied Physics · 1998 · 1.1K citations

, , +17

MOCVD of Bi2Te3, Sb2Te3 and their superlattice structures for thin-film thermoelectric applications

R. Venkatasubramanian, T.S. Colpitts, E. Watko et al. · Journal of Crystal Growth · 1997 · 284 citations

, , +14

The thermoelectric properties and crystallography of Bi-Sb-Te-Se thin films grown by ion beam sputtering

H. Noro, K. Satô, H. Kagechika · Journal of Applied Physics · 1993 · 130 citations

, , +17

InP optical constants between 0.75 and 5.0 eV determined by variable-angle spectroscopic ellipsometry

Craig M. Herzinger, Paul G. Snyder, Blaine Johs et al. · Journal of Applied Physics · 1995 · 123 citations

, , +15