Publication | Closed Access
In-situ monitoring of the growth of Bi2 Te2 and Sb2 Te3 films and Bi2 Te3-Sb2 Te3 superlattice using spectroscopic ellipsometry
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Citations
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References
2001
Year
Materials ScienceTransition Metal ChalcogenidesMaterial AnalysisEngineeringCrystal Growth TechnologySurface ScienceApplied PhysicsCondensed Matter PhysicsBi2 Te2Sb2 Te3 FilmsSpectroscopic EllipsometryEpitaxial Growth
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