Journal of Materials Chemistry C · 2021 · 33 citations · 60 references
Aluminium NitrideOptical MaterialsEngineeringElectrode-electrolyte InterfaceTrue MeritsEnergy Storage DeviceCompound SemiconductorMaterials ScienceMaterials EngineeringElectrical EngineeringOxide ElectronicsEnergy StorageElectrochemical ProcessElectrochemistryApplied PhysicsElectrochemical Energy StorageThin FilmsAluminum-ion-intercalation NickelOptoelectronics
Unleashing the true merits of aluminum-ion-intercalation nickel oxide thin films for EESDs by taking a closer look at the optical modulation, energy storage, and diffusion and reaction kinetics of the NiO/Al 3+ system.
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Shengliang Zhang, Sheng Cao, Tianran Zhang et al. · Energy & Environmental Science · 2018 · 363 citations