Nanotechnology · 2021 · 11 citations · 43 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor MaterialsConductive MaterialsOptoelectronic MaterialsSemiconductor Device MaterialsSemiconductor Thin FilmsThin Film Electrical PropertiesThin Film Optical PropertiesOptical PropertiesOptoelectronic PropertiesResistivityTransparent Conducting FilmsTransparent Conducting MaterialsTransparent Conductive FilmsTransparent ElectronicsX-ray Diffraction Analysis
Abstract p-type CuI films with optimized optoelectronic performance were synthesized by solid-phase iodination of Cu 3 N precursor films at room temperature. The effects of the deposition power of Cu 3 N precursors on the structural, electrical, and optical properties of the CuI films were systematically investigated. X-ray diffraction results show that all the CuI films possess a zinc-blende structure. When the deposition power of Cu 3 N precursors was 140 W, the CuI films present a high transmittance above 84% in the visible region, due to their smaller root-mean-square roughness values of 9.23 nm. Moreover, these films also have a low resistivity of 1.63 × 10 –2 Ω·cm and a boosted figure of merit of 140.7 MΩ −1 . These results are significant achievements among various p-types TCOs, confirming the promising prospects of CuI as a p-type transparent semiconductor applied in transparent electronics.
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<i>P</i>-type transparent conducting oxides
Kelvin H. L. Zhang, Kai Xi, M. G. Blamire et al. · Journal of Physics Condensed Matter · 2016 · 402 citations