Electron spectrometry at the µeV level and the electron affinities of Si and F

Abstract

Photodetachment microscopy of the negative ions Si- and F- has made it possible to measure the electron affinities of silicon and fluorine with improved accuracy. The new recommended electron affinities of 28Si and 19F are 11 207.252(18) and 27 432.446(19) cm-1, i.e. 1.389 5220(24) and 3.401 1895(25) eV, respectively.