Extended-Performance “SuperCurrent” Cryogen-Free Transport Critical-Current Measurement System

Abstract

We have previously reported the development of a cryogen-free critical current characterization system able to measure field-angle dependences of voltage-current characteristics of short-length superconducting tapes to temperatures of 25 K, fields up to 8 T and currents up to 875 A. We have now extended the existing system and built a parallel system which further extends the parameter space to 10 K, 12 T, 1600 A. With a software suite that fully automates batch measurements we have been able to generate detailed coverage of the temperature-field-angle-current parameter space relevant to many of the applications proposed for high-temperature superconducting tapes. We describe the improvements to the system and present data from commercial tape samples that illustrates the utility of the instrument.